Dislocation and microindentation analysis of vapour grown Bi2Te3‐xSex whiskers

The structural defects and microhardness of Bi₂Te_3‐xSe_x whiskers (x = 0, 0.2 and 0.4 at% Se) grown by physical vapour deposition (PVD) method have been investigated. Concentric pairs of dislocation loops were observed on the as‐grown surfaces of short hexagonal prisms. A systematic study of dislocations in these crystals was carried out by chemical etching technique. The effects of Se doping, annealing and quenching on the mechanical properties have also been studied on the prism faces of Bi₂Te_3‐xSe_x whiskers. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)