Dopant-induced excimer laser ablation of poly(tetrafluoroethylene) |
| |
Authors: | F. D. Egitto C. R. Davis |
| |
Affiliation: | (1) IBM Corporation, Technology Products, 13760 Endicott, NY, USA |
| |
Abstract: | Clean ablation of poly(tetrafluoroethylene) (PTFE) at etch rates in excess of 7µm/pulse has been achieved with an excimer laser using 308nm radiation and a 25 ns pulse width. This was accomplished by doping the ultraviolet-transparent PTFE polymer with polyimide. Ablation rates were investigated as a function of fluence in the range from 1 to 12J/cm2 and dopant levels up to 15% (wt/wt). Results show that at a given fluence there exists an optimum absorption coefficient max, for which maximum ablation rates are achieved. The value of max was found to decrease with increasing fluence. The relationship between max and fluence was determined from existing ablation rate models and found to compare favorably with empirical results. |
| |
Keywords: | 42.55.Gp 78.65 81.60.Jw 82.50 |
本文献已被 SpringerLink 等数据库收录! |
|