作者单位: | Laboratory of Structure Analysis, University of Science and Technology of China, Hefei 230026, China;Laboratory of Structure Analysis, University of Science and Technology of China, Hefei 230026, China;Laboratory of Structure Analysis, University of Science and Technology of China, Hefei 230026, China;Laboratory of Structure Analysis, University of Science and Technology of China, Hefei 230026, China;Laboratory of Structure Analysis, University of Science and Technology of China, Hefei 230026, China;Institute of Semiconductors, Academia Sinica, Beijing 100083, China |