X-ray investigation of monolayers formed at the soft air/water interface |
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Affiliation: | 1. CNR-Istituto per l''Energetica e le Interfasi, Genova - Italy;2. Max-Planck-Institut für Kolloid- und Grenzflächenforschung, Potsdam - Germany;1. São Carlos Institute of Physics, University of São Paulo, CP 369, São Carlos, SP 13560-970, Brazil;2. Faculty of Science and Technology, UNESP, Presidente Prudente, CEP 19060-900 SP,Brazil;1. Max-Planck Institute of Colloids & Interfaces, Potsdam/Golm, Germany;2. Sharif University of Technology, Tehran, Iran;3. Chemical Engineering Department, University of Tehran, Tehran, Iran |
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Abstract: | Gibbs or Langmuir monolayers formed at the soft air/liquid interface are easy to handle and versatile model systems for material and life sciences. The phase state of the monolayers can be modified by lateral compression of the film while the layer structural changes are monitored by highly sensitive surface characterization techniques. The use of high brilliant synchrotron light sources for X-ray experiments is essential for the monolayer research. The present review highlights the recent achievements recorded in the monolayer field with a special emphasis on different synchrotron based X-ray characterizing methods as: grazing incidence X-ray diffraction, X-ray reflectivity and total reflection X-ray fluorescence. Some examples of single-chain surfactants, special sugar lipids, and semifluorinated compounds are given. Additionally, thin layers formed by peptides, polymers or nanoparticles are highlighted. |
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