|
|||||
|
|
Analysis of X-ray and electron-beam diffraction patterns from poly(dipropyl siloxane) |
|
| Authors: | D.R. Petersen D.R Carter C.L. Lee |
| Affiliation: | 1. Chemical Physics Research Laboratory, The Dow Chemical Company Midland, Michigan, USA;2. Dow Corning Corporation Midland, Michigan, USA |
| Abstract: | The crystalline polysiloxane (—R2SiO—)n. where R= n-propyl, has been characterized through high-resolution X-ray diffraction patterns of the polycrystalline material and selected-area electron-beam diffraction patterns of single crystals. The smallest unit cell consistent with the diffraction data is tetragonal, with dimensions a = 9.52 ? 0.01 and c = 9.40 ± 0.05 . The probable space group is P41 (or P43). |
| Keywords: | Lower‐melting temperature component processing Poly(ethylene terephthalate) (PET)/polyethylene (PE) and polycarbonate (PC)/polyethylene blends Interfacial contact Tensile rate Plastic deformation |