We compute scattering form factors for SANS from labeled paths in Gaussian phantom networks in which junctions alternate regularly in their functionality (the number of chains emanating from a junction). Our calculations are based on the James‐Guth model of rubber‐like elasticity, which assumes that fluctuations are strain independent, while mean vectors transform affinely with the applied strain. Kratky plots for scattering from isotropic and uniaxially stretched bifunctional networks are computed and compared with corresponding plots for the simpler unifunctional networks. The results show the effects of the length of the labeled path, extent of deformation, direction of scattering with respect to the principal axis of the deformation and the functionalities of the network junctions.
