| Abstract: | The line profile form of Raman spectra can be analyzed using the very same approach and software used for diffractogram deconvolution via the Rietveld approach. In both cases the ‘true’ profile containing information about the sample must be separated from the instrument's profile function (and potentially from the emission profile) which can be achieved by deconvolution. In this first part of a two‐part study we demonstrate how the instrument's function can be described via a Gaussian function profile (yielding the very same result as several convoluted hat functions) using several examples (diamond, calcite, silicon and silicon carbide) for which true Raman bandwidth values are presented (assuming the true band profile to be Lorentzian). Also, asymmetrical bands can be described and analyzed via the presented deconvolution approach. The second part of this study will discuss and apply this method for studying the radiation‐induced damage in zircon grains (metamictization). Copyright © 2008 John Wiley & Sons, Ltd. |
