Composition of the “GaAs” quantum dot,grown by droplet epitaxy |
| |
Authors: | Á . Nemcsics,L. Tó th,L. Dobos,Ch. Heyn,A. Stemmann,A. Schramm,H. Welsch,W. Hansen |
| |
Affiliation: | 1. Institute for Microelectronics and Technology, Tavaszmez? u. 17. H-1084 Budapest, Hungary;2. Research Institute for Technical Physics and Materials Science, P.O. Box 49 H-1525 Budapest, Hungary;3. Institut für Angewandte Physik und Zentrum für Mikrostrukturforschung, Jungiusstraße 11, D-20355 Hamburg, Germany |
| |
Abstract: | Self-assembled strain-free quantum dot (QD) structures were grown on AlGaAs surface by the droplet epitaxal method. The QDs were developed from pure Ga droplets under As pressure. The QDs were investigated by atomic force microscopy (AFM) and transmission electron microscopy (TEM). Both techniques show that the QDs are very uniform in size and their distribution on the surface is also homogeneous. The high resolution cross-sectional TEM investigation shows perfect lattice matching between the QD and the substrate, and also the faceting of the side walls of QD can be identified exactly by lattice planes. Analytical TEM (elemental mapping by EELS) unambiguously identifies the presence of Al in the QD. |
| |
Keywords: | MBE GaAs Droplet epitaxy Quantum dot (QD) Transmission electron microscopy (TEM) Composition map |
本文献已被 ScienceDirect 等数据库收录! |
|