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Variation of lattice dimensions in epitaxial SnS films on MgO(001)
Authors:Hiroshi Nozaki  Mitsuko Onoda  Masamitsu Sekita  Kousuke Kosuda  Toshiaki Wada
Affiliation:National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki, 305-0044, Japan
Abstract:
Epitaxial and polycrystalline SnS films were prepared on MgO(001) and glass substrates using molecular beam epitaxy. The films were characterized by X-ray diffraction method. The orientations of epitaxial films were (010)[100]SnS||(001)[100]MgO or (010)[001]SnS||(001)[100]MgO. Lattice parameters of the polycrystalline film closely resembled those of bulk SnS at room temperature. However, the lattice parameters of epitaxial films varied widely and were very different from those of bulk SnS at room temperature. Considering the lattice dimensions and a/c ratio, the films roughly correspond to bulk SnS at elevated temperatures from 371 to 666 K. SEM images of the films showed needle- or circular-like SnS crystallites segregated from the epitaxial films. Respective energies of indirect band gaps of the films and refractive index of the polycrystalline film were estimated using results of optical transmission experiments.
Keywords:Tin sulfide   Epitaxial films   Molecular beam epitaxy   X-ray diffraction   Magnesium oxide   Lattice parameters   SEM image   Segregation   Band gap   Refractive index
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