Estimation of surface charges on dielectric materials for high power rf windows |
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Authors: | Shinichiro Michizono Yoshio Saito Yasushi Yamano |
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Affiliation: | a High Energy Accelerator Research Organization (KEK), Tsukuba, Ibaraki 305-0801, Japan b Faculty of Engineering, Gadjah Mada University, Yogyakarta 55284, Indonesia c Faculty of Engineering, Saitama University, Saitama 338-8570, Japan |
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Abstract: | The surface discharges observed at rf windows and vacuum circuit breakers (VCBs) are one of the difficulties faced when developing high-power rf windows or compact VCBs. The surface discharge is considered to take place due to the release of the surface charges. Despite the importance of the surface charging/discharging, these phenomena have not been well evaluated. In this paper, the surface charges are estimated using the multipulse method, where electron beam irradiates a sample up to the saturation condition of surface charges. The amount of surface charges on alumina and TiN coated alumina are compared and the charging mechanism is discussed. |
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Keywords: | 79.20.Hx |
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