Electrical characteristics of p-Si/TiO2/Al and p-Si/TiO2-Zr/Al Schottky devices |
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| Authors: | ?brahim Hüdai Ta?demir ?lbilge Dökme |
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| Institution: | 1. Faculty of Arts and Science, Department of Chemistry, Amasya University, Amasya, Turkey;2. Faculty of Gazi Education, Department of Science Education, Gazi University, Ankara, Turkey |
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| Abstract: | Electrical devices involve different types of diode in prospective electronics is of great importance. In this study, p-type Si surface was covered with thin film of TiO2 dispersion in H2O to construct p-Si/TiO2/Al Schottky barrier diode (D1) and the other one with TiO2 dispersion doped with zirconium to construct p-Si/TiO2-Zr/Al diode (D2) by drop-casting method in the same conditions. Electrical properties of as-prepared diodes and effect of zirconium as a dopant were investigated. Current–voltage (I–V) characteristics of these devices were measured at ambient conditions. Some parameters including ideality factor (n), barrier height (ΦB0), series resistance (Rs) and interface state density (Nss) were calculated from I–V behaviours of diodes. Structural comparisons were based on SEM and EDX measurements. Experimental results indicated that electrical parameters of p-Si/TiO2/Al Schottky device were influenced by the zirconium dopant in TiO2. |
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| Keywords: | p-Si/TiO2-Zr/Al structure I–V characteristic interface states series resistance |
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