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Influence of the substrate optical properties on the backscattering of contaminated microstructures |
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| Authors: | P. Albella, F. Moreno, J.M. Saiz,F. Gonz lez |
| Affiliation: | aGrupo de Óptica, Departamento de Física Aplicada, Universidad de Cantabria, 39006 Santander, Cantabria, Spain |
| Abstract: | The presence of small defects in micron-sized structured surfaces introduces small changes in the backscattering that can be assessed by means of an integrated parameter. In this work the influence of the optical properties of the substrate on this technique is analyzed for two different configurations: defect on the microstructure and defect on the substrate beside the microstructure. |
| Keywords: | Backscattering Particles Substrate Optical properties |
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