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A novel high-resolution interference spectrometer |
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| Authors: | TL Helg TH Barnes TG Haskell |
| Institution: | a1 Department of Physics, The University of Auckland, Private Bag 92019, Auckland, New Zealand a2 Industrial Research Ltd, P.O. Box 31-310, Lower Hutt, New Zealand |
| Abstract: | A novel precision wavemeter is presented with a resolution of better than 0·01 nm. A Sagnac interferometer with two diffraction gratings forms the basis of the instrument. Using spatial heterodyning techniques and a CCD camera/frame grabber data acquisition system allows fast computer control and power spectrum analysis. The mode structure and mode hopping characteristics of a typical laser diode were examined as a function of diode injection current. |
| Keywords: | Spectrometers Interferometers Diffraction gratings Charge coupled devices Cameras Data acquisition Computer control Spectrum analysis Semiconductor lasers Laser modes Electric currents High-resolution interference spectrometers Sagnac interferometer Camera/frame grabber data acquisition systems |
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