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Contouring of artwork surface by fringe projection and FFT analysis
Authors:Giuseppe Schirripa Spagnolo   Giorgio Guattari   Carmine Sapia   Dario Ambrosini   Domenica Paoletti  Giorgio Accardo
Affiliation:a INFM – Dip. di Ingegneria Elettronica, Università degli Studi “Roma Tre”, Via Della Vasca Navale, 84 – 00146 Roma, Italy;b INFM – Dip.Energetica, Università degli Studi Dell'Aquila, Loc. Monteluco di Roio, 67040 Roio Poggio, L'Aquila – Italy;c ICR – Laboratorio di Fisica, Via San Michele, 23 – 00153 Roma, Italy
Abstract:
In the present work, we propose a simple optical method to perform profilometry on works of art. The method is based on the projection of a Ronchi grating onto the surface to be analyzed. When viewed at an angle different from the projection angle, the grid pattern appears deformed by the surface shape. This pattern is digitized, by a high-resolution CCD camera, and then processed using a Fourier transform analysis. The technique is free from the errors caused by higher harmonic components of the grating pattern. Furthermore, the method relies on very simple equipment and it is therefore suitable for in situ measurements. Theoretical details and examples of the technique in operation are given.
Keywords:Projection grating   Phase map   Shape measurement   Fourier transform
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