Oxygen-deficient line defects in an ultrathin aluminum oxide film |
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Authors: | Schmid M Shishkin M Kresse G Napetschnig E Varga P Kulawik M Nilius N Rust H-P Freund H-J |
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Affiliation: | Institut für Allgemeine Physik, Technische Universit?t Wien, A 1040 Wien, Austria. |
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Abstract: | A model for the straight antiphase domain boundary of the ultrathin aluminum oxide film on the NiAl(110) substrate is derived from scanning tunneling microscopy measurements and density-functional theory calculations. Although the local bonding environment of the perfect film is maintained, the structure is oxygen deficient and possesses a favorable adsorption site. The domain boundary exhibits a downwards band bending and three characteristic unoccupied electronic states, in excellent agreement with scanning tunneling spectroscopy measurements. |
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