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利用白光干涉谱测定云母片的快慢轴
引用本文:刘佳,徐平,陈子瑜,Jacques TABUTEAU. 利用白光干涉谱测定云母片的快慢轴[J]. 大学物理, 2011, 0(9): 43-44,49
作者姓名:刘佳  徐平  陈子瑜  Jacques TABUTEAU
作者单位:内蒙古科技大学数理与生物工程学院;北京航空航天大学物理科学与核能工程学院;北京航空航天大学中法工程师学院;
基金项目:2008年北京市高等学校教育教学改革立项项目资助; 内蒙古科技大学大学物理与工程学科结合平台建设项目“《大学物理》课程与工科专业结合平台建设”(JY2010104)资助
摘    要:
白光照射到透明云母薄片时,后侧内表面产生的反射光与入射光会在云母片的前表面发生干涉.利用光谱仪可以观察到由于干涉而形成的条状光谱.改变入射光的偏振方向,可以观察到由于云母薄片双折射特性引起的干涉条纹的移动.根据条纹移动的方向,可以判定出云母片两正交的光轴方向上折射率的差异,从而判定出其快轴和慢轴.

关 键 词:云母片  偏振光  光谱仪  快慢轴

Determination of the fast and slow axis of the mica plate with interference spectroscopy of the white light
LIU Jia,XU Ping,,CHEN Zi-yu,Jacques TABUTEAU. Determination of the fast and slow axis of the mica plate with interference spectroscopy of the white light[J]. College Physics, 2011, 0(9): 43-44,49
Authors:LIU Jia  XU Ping    CHEN Zi-yu  Jacques TABUTEAU
Affiliation:LIU Jia1,XU Ping2,3,CHEN Zi-yu2,Jacques TABUTEAU3(1.School of Mathematics,Physics and Biological Engineering,Inner Mongolia University of Science and TechnologyBaotou,Inner Mongolia 014010,China,2.School of Physics and Nuclear Energy Engineering,Beihang University,Beijing 100191,3.Sino-French Engineer School,China)
Abstract:
The reflected light from the inner surface of the posterior side will interfere with the incidence light,when the white light irradiate to the mica plate.A fluted spectrum with different colors can be observed by using spectrometer.Changing the polarization direction of incident light,the difference of index at orthogonal optical axis of the mica plate can be rapidly determined upon the moving direction of the grooves since the birefringence,and then the fast and slow axis can be deduced.
Keywords:mica plate  polarized light  spectrometer  fast and slow axis  
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