Crystallisation of magnetron sputtered amorphous Si1− x C x films (x = 1/3) studied by grazing incidence X-ray diffractometry 期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

Crystallisation of magnetron sputtered amorphous Si1− x C x films (x = 1/3) studied by grazing incidence X-ray diffractometry

摘要：