Thickness-dependent orientation evolution in nickel thin films grown on yttria-stabilized zirconia single crystals |
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Authors: | B Viswanath Changhyun Ko |
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Institution: | Harvard School of Engineering and Applied Sciences, Harvard University , Cambridge , Massachusetts 02138 , USA |
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Abstract: | Microstructure evolution along with crystallographic orientation change as a function of film thickness was investigated in Ni thin films grown on (100) yttria-stabilized zirconia (YSZ) single crystal substrates. Texture development with two different orientation relationships, OR1: Ni {111}//YSZ {100} and OR2: Ni {100}//YSZ {100}, cube on cube orientation were identified by X-ray diffraction and transmission electron microscopy depending on the film thickness. The observed orientation transition reveals the existence of a critical thickness (~320?nm) favoring two different orientations in sputtered Ni films on YSZ (100) substrate. |
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Keywords: | metal–ceramic interface orientation transition texture development solid oxide fuel cell nickel |
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