Thermal expansion of the Sn2P2(Se0.28S0.72)6 solid solutions |
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Authors: | A. Say O. Mys |
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Affiliation: | Institute of Physical Optics , 23 Dragomanov St., 79005 Lviv, Ukraine |
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Abstract: | In the present work, we have experimentally studied and analysed the dilatometric properties of Sn2P2(Se0.28S0.72)6 crystals during ferroelectric phase transition. A complete matrix of thermal expansion tensors as well as the characteristic surface of the thermal expansion tensor has been obtained. The critical exponent for the volume thermal expansion coefficient in Sn2P2(Se0.28S0.72)6 crystals has been determined to be equal to 0.50 ± 0.06, which is peculiar to tricritical behaviour. Non-agreement in the values of the critical exponents evaluated from the temperature dependencies of relative elongation (0.17 ± 0.01) and volume thermal expansion coefficient (0.50 ± 0.06) is shown to be due to the possible temperature rotation of the spontaneous polarisation vector. |
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Keywords: | ferroelectrics phase diagram thermal expansion Liftshitz point |
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