Photoselective laser photo-ion microscopy with 5 nm resolution |
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Authors: | S. K. Sekatskii D. V. Serebryakov V. S. Letokhov |
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Affiliation: | (1) Institute of Spectroscopy, Russian Academy of Sciences, 142092 Troitsk, Moscow Region, Russia |
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Abstract: | Spectral selectivity has been attained in the method of field-ion microscopy with a spatial resolution of about 5 nm and time-of-flight determination of the photo-ion masses. Light-absorbing CdSxSe1−x nanocrystals in a transparent glass matrix are detected by irradiating field tips made from red light filters with copper-vapor laser radiation. The nanocrystals appeared in the photo-ion images as bright spots on a dark background. Pis’ma Zh. éksp. Teor. Fiz. 67, No. 7, 450–454 (10 April 1998) |
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