Voltammetric determination of 4-chloro-3-methylphenol at a glassy carbon electrode

Summary Thin films of NiCrSi with thicknesses ranging from 3 to 80 nm were irradiated by 15 keV electrons. The angle of incidence was varied between normal and nearly grazing incidence by tilting the sample up to =85°. At oblique incidence the detection limits of energy dispersive electron probe microanalysis for surface layers are higher by at least one order of magnitude than at normal incidence. Less than 1/10 of a monolayer is detectable. Furthermore, one gets informations concerning the depth distribution of the constituents. For example, less than 3 monolayers of Cu were detected and localized under a 9 nm thick NiCrSi film on vitreous carbon.Parts of this paper were presented as lecture No B8L-5 at the European Conference EUROANALYSIS VII, Vienna, August 26–31, 1990