Analysis of sensitivity and low-frequency intensity noise characteristics of Bragg reflector lasers induced by reflected light |
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Authors: | T. Tanbun-Ek |
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Affiliation: | (1) The Swedish Institute of Microelectronics, PO Box 1084, S-164 21 Kista, Sweden;(2) Present address: AT&T Bell Laboratories, 600 Mountain Avenue, 07974 Murray Hill, New Jersey, USA |
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Abstract: | ![]() An analysis of the sensitivity and low-frequency intensity noise characteristics of Bragg reflector lasers is given. It is found that Bragg reflector lasers have increased sensitivity to reflected light for low grating coupling strength ( l) and is similar to that of Fabry-Perot lasers except for high l values. Also, the intensity noise can be reduced by operating the device at high injection level. |
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