| Abstract: | We study the effect of the substrate temperature and the temperature and conditions of thermomagnetic treatment on the magnetic and electrical properties of Fe10Ni90 films deposited on single-crystal silicon substrates by ion-beam sputtering. The laws found to govern these properties are associated with the transformations of the microstructure of the films. The maximum magnetoresistance ratio is shown to occur in films deposited on slightly heated substrates and vacuum-annealed at about 500 C. The coercive force, anisotropy field in the plane of the films, the density of bonds at domain walls, and the magnetoresistance ratio are determined as functions of the thickness.Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 1, pp. 9–13, January, 1991.We thank E. I. Teitel and N. N. Schchegoleva for measuring the microstructure parameters of the films. |
