Single- and multi-shot laser-induced damages of Ta_2O_5/SiO_2 dielectric mirrors at 1064 nm |
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| Authors: | Ying Wang Hongbo He Yuan’an Zhao Yongguang Shan Dawei Li and Chaoyang Wei |
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| Institution: | 1Key Laboratory of Materials for High Power Lasers, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Science, Shanghai 201800, China 2Graduate University of the Chinese Academy of Sciences, Beijing 100049, China |
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| Abstract: | Ta2O5/SiO2 dielectric mirrors deposited by ion beam sputtering (IBS) are studied. The multi-shot laserinduced damage threshold (LIDT) and its dependence on the number of shots are investigated, after which we find that the multi-shot LIDT is lower than that of single-shot. The accumulation effects of defects play an important role in the multi-shot laser damage. A simple model, which includes the conduction band electron production vsa multiphoton and impact ionizations, is presented to explain the experime... |
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