Geometric micron-moiré |
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Authors: | F. L. Dai Z. Y. Wang |
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Affiliation: | Department of Engineering Mechanics, Tsinghua University, Beijing 100084, People's Republic of China |
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Abstract: | A high spatial resolution and high-sensitivity geometric micron-moiré method is presented. The method is based upon classical geometric moiré method and microscopic principle, the frequency of the specimen and reference gratings used in this method can be higher than 1000 lines/mm. By a microscopic moiré system, the high-frequency gratings could be magnified to a low-frequency level, so geometric moiré patterns can be formed. Experiments show that both the spatial resolution and the sensitivity can reach or exceed micron-level. |
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Keywords: | High resolution High sensitivity Geometric micron-moiré |
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