Spectrophotometric calibration of a quarterwave plate |
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| Authors: | N N Nagib M S Khalil S A Khodier |
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| Institution: | National Institute for Standards, P.O. Box 136, 12211 Giza, Egypt |
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| Abstract: | A new photometric method for calibrating a quarterwave phase plate is presented and the underlying physical phenomenon is explained. A mica sheet of thickness about 30 μm was found to introduce quarterwave phase retardance at 515 nm. The accuracy of the method and the sources of error are discussed. |
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| Keywords: | Phase retardance Muscovite mica Spectrophotometer Poincaré sphere |
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