XRD and AFM study of radiation damage induced by swift heavy ions in Y3Al5O12 single crystals |
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Authors: | M. Izerrouken R. Bucher A. Meftah M. Maaza |
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Affiliation: | 1. Centre de Recherche Nucléaire de Draria , BP 43, Sebbala, Draria, Algiers, Algeria izerrouken@yahoo.com;3. iThemba LABS , PO Box 722, Somerset West, 7129, South Africa;4. LRPCSI , Université 20 Ao?t 55 – Skikda , route d'El-Hadaik, BP 26, 21000, Skikda, Algeria |
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Abstract: | Defects induced in Y3Al5O12 single crystals by swift heavy ions are investigated by X-ray diffraction (XRD) and atomic force microscopy. The irradiation was performed at GANIL with 561 MeV 51Cr, 466 MeV 128Te, and 957 MeV 208Pb ions. The XRD data reveal that the lattice strain increases with increasing electronic stopping power, whereas the hillock parameters (height and diameter) are not influenced by the electronic stopping power. According to our experimental data, for the same mean electronic stopping power, the hillock parameters are more pronounced for the lower range in contrast to swelling measurements. The experimental data show a strong increase in the hillock parameter at higher fluence, indicating the amorphization of Y3Al5O12 single crystals. |
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Keywords: | radiation damage swift heavy ions surface nanostructure |
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