Defect influence on charge transport in chalcogenide glasses

Abstract

Conductivity of chalcogenide glasses was measured as a function of temperature (290–340 K) and frequency (10^?4–10^?1 Hz). Frequency dependence of conductivity can be approximated by a power law G～ω^s (S < 1). The relaxation maximum of dielectric losses was found. The dielectric constant ? decreases with frequency rise. The obtained results are discussed in terms of the defect structure model.