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Transmission electron microscopy study of defects in AlN crystals with rough and smooth surface grains |
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| Authors: | LO Nyakiti J Chaudhuri Z Gu JH Edgar |
| Institution: | 1. Naval Research Laboratory, 4555Overlook Ave, SW Washington, DC 20375, USA;2. Department of Mechanical Engineering, Texas Tech University, Lubbock, TX 79409, USA;3. Department of Chemical Engineering, Kansas State University, Manhattan, KS 66506, USA |
| Abstract: | Defects present in (0 0 0 1) textured polycrystalline AlN grown by the sublimation–recombination method were analyzed using transmission electron microscopy (TEM) methods. Grains in the polycrystalline boule had either a smooth or a rough surface. The rough surface grains had mainly edge dislocations, whereas the smooth surface grains had some sub-grain boundaries and were mostly free of dislocations. Dislocations at the grain boundaries were pinned and could not be annihilated. |
| Keywords: | A1 Dislocations A1 Grain boundaries A1 Polarity A1 Transmission electron microscopy A3 Sublimation&ndash recombination crystal growth B1 Aluminum nitride |
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