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Structural and electrophysical characteristics of YBCO films on sapphire
Authors:A. S. Petrov  Yu. I. Tsyganok  E. P. Naiden  T. L. Levdikova  V. K. Golovleva  V. T. Podlesnykh  A. S. Tret’yakov  V. F. Vratskikh
Affiliation:A. S. Petrov, Yu. I. Tsyganok, E. P. Naiden, T. L. Levdikova, V. K. Golovleva, V. T. Podlesnykh, A. S. Tret’yakov and V. F. Vratskikh
Abstract:
We present experimental results for the structural and electrophysical characteristics of YBCO films deposited on sapphire substrates without an interface layer. The films were deposited by laser sputtering of a target. We establish certain relationships between the structural and electrophysical characteristics of the films. We show the films’ electrophysical parameters are determined by the number of "defective" blocks whose [010] axes are at random angles relative to the [100] axis of the substrate. V. D. Kuznetsov Siberian Physicotechnical Institute, Tomsk University. Translated from Izvestiya Vysshikh Uchebnykh Zaved, Fizika, No. 5, pp. 75–78, May, 1998.
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