Sulphur-doped silicon background-limited infrared photodetectors near 77 K

The photoconductive properties of sulphur-doped extrinsic silicon infrared detectors prepared by closed-tube diffusion techniques have been investigated. Spectral response data show that this material would be suitable for thermal imaging of 3–5 μm radiation, whilst detectivity measurements as a function of temperature indicate that background-limited operation is achievable near liquid nitrogen temperature (77 K).