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Atomic structure of highly strained BiFeO3 thin films
Authors:Rossell M D  Erni R  Prange M P  Idrobo J-C  Luo W  Zeches R J  Pantelides S T  Ramesh R
Affiliation:Electron Microscopy Center, Empa, Swiss Federal Laboratories for Materials Science and Technology, CH-8600 Dübendorf, Switzerland. marta.rossell@empa.ch
Abstract:
We determine the atomic structure of the pseudotetragonal T phase and the pseudorhombohedral R phase in highly strained multiferroic BiFeO(3) thin films by using a combination of atomic-resolution scanning transmission electron microscopy and electron energy-loss spectroscopy. The coordination of the Fe atoms and their displacement relative to the O and Bi positions are assessed by direct imaging. These observations allow us to interpret the electronic structure data derived from electron energy-loss spectroscopy and provide evidence for the giant spontaneous polarization in strained BiFeO(3) thin films.
Keywords:
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