Raman scattering from gas-evaporated silicon small particles

Raman scattering measurements are reported on silicon small particles prepared by gas-evaporation technique. The crystalline structure is also observed for the sample having 70 A particles in average size. Four resolved component modes with Gaussian distribution function are identified with the three usual modes (LA, TO and allowed-TO) and a new surface mode. The surface mode of silicon particle, whose relative integrated intensity decrease with an increase of the particle size, is presented for the first time.