Characterization of thin metastable vanadium oxide films by Raman spectroscopy |
| |
Authors: | J. P. Schreckenbach Klaus Witke Diethard Butte Günter Marx |
| |
Affiliation: | (1) Institut für Chemie, Technische Universit?t Chemnitz, D-09107 Chemnitz, XX;(2) Bundesanstalt für Materialforschung und -prüfung Berlin, D-12200 Berlin, XX |
| |
Abstract: | Thin films are potentiodynamically generated on vanadium in Ba2+/acetate electrolyte systems at high voltages. The influence of the anodic potential up to 400 V on the composition and structure of the about 500 nm thin anodic conversion films are investigated. Raman spectroscopy indicates that different film types depend on the electrochemical process parameters. The relationship between the Raman laser excitation power and the amorphous or microcrystalline film structure is also discussed. Beside metastable disordered structures the films contain crystalline phases of V2O5, V4O9 and barium vanadate, respectively. Received: 15 July 1997 / Revised: 16 February 1998 / Accepted: 21 February 1998 |
| |
Keywords: | |
本文献已被 SpringerLink 等数据库收录! |
|