Crystallization and melting of isotactic polypropylene crystallized from quiescent melt and stress‐induced localized melt

Temperature dependency of crystalline lamellar thickness during crystallization and subsequent melting in isotactic polypropylene crystallized from both quiescent molten state and stress‐induced localized melt was investigated using small angle X‐ray scattering technique. Both cases yield well‐defined crystallization lines where inverse lamellar thickness is linearly dependent on crystallization temperature with the stretching‐induced crystallization line shifted slightly to smaller thickness direction than the isothermal crystallization one indicating both crystallization processes being mediated a mesomorphic phase. However, crystallites obtained via different routes (quiescent melt or stress‐induced localized melt) show different melting behaviors. The one from isothermal crystallization melted directly without significant changing in lamellar thickness yielding well‐defined melting line whereas stress‐induced crystallites followed a recrystallization line. Such results can be associated with the different extent of stabilization of crystallites obtained through different crystallization routes. © 2017 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2017 , 55, 957–963