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Parametric resonance and Hopf bifurcation analysis for a MEMS resonator
Authors:Cas van der AvoortRein van der Hout  Joost Hulshof
Affiliation:
  • a NXP Semiconductors Research, Prof. Holstlaan 4, NL-5656 AA, Eindhoven, The Netherlands
  • b VU University, Faculty of Science, De Boelelaan 1081 A, 1081 HV Amsterdam, The Netherlands
  • Abstract:
    We study the response of a MEMS resonator, driven in an in-plane length-extensional mode of excitation. It is observed that the amplitude of the resulting vibration has an upper bound, i.e., the response shows saturation. We present a model for this phenomenon, incorporating interaction with a bending mode. We show that this model accurately describes the observed phenomena. The in-plane (“trivial”) mode is shown to be stable up to a critical value of the amplitude of the excitation. At this value, a new “bending” branch of solutions bifurcates. For appropriate values of the parameters, a subsequent Hopf bifurcation causes a beating phenomenon, in accordance with experimental observations.
    Keywords:MEMS resonator   Clipping   Beating   Hopf bifurcation
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