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Optimization of mark edge recording waveform for a phase change rewritable optical disk using a 680 nm laser diode
Authors:Takashi Ishida  Mamoru Shoji  Yoshiyuki Miyabata  Yasumasa Shibata  Eiji Ohno  Shunji Ohaira
Affiliation:1. Information and Communications Technology Laboratory, Matsushita Electric Industrial Co., Ltd., 1006 Kadoma, Osaka, 571, Japan
2. Materrals and Devices Laboratory, Matsushita Electric Industrial Co., Ltd., 1006 Kadoma, Osaka, 571, Japan
Abstract:A high density mark edge recording method on a phase change rewritable disk is reported. A carrier-to-noise ratio of 55 dB for a mark length of 0.55,μm is obtained by using a 680 nm, NA 0.6 head and a phase change rewritable disk. In mark edge recording, it is necessary to record each mark in correct length. A new laser power modulation pattern is proposed. This pattern consists of a first-pulse, a multi-pulse chain and a last-pulse. Both positions of the first-ptilse and the last-pulse are movable. By adjusting these positions, a jitter, σ/Tw (Tw is window margin), is improved to 6.5% in high density EFM (Eight to Fourteen Modulation) recording of 0.4 μm/bit.
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