Analytical Potentials and Features of Atomic Emission Analysis Using Electron-Impact Excitation of Atoms in Helium under Atmospheric Pressure

A device is described for the atomic emission analysis of vaporous samples using electron-impact excitation in helium under atmospheric pressure. The device consists of a cathode atomizer with a test sample applied onto it and the anode located at 1–3 mm from the cathode. The electrons emitted by the cathode upon heating are accelerated by applying a constant voltage to the electrodes. The mechanism for the formation of a non-self-sustained gas discharge between the cathode and anode is considered and the properties of the discharge are compared to those of the known discharges used in atomic emission spectrometry. The influence of atomization temperature and helium pressure on the analytical and background signals was studied. It is shown that, under certain conditions, the analytical signal increases with helium pressure. The relative detection limits attained for a number of elements are from tenths to dozens of nanogram per liter; this is two or three orders of magnitude lower than those in inductively coupled plasma atomic emission spectrometry and of the same order of magnitude as detection limits in inductively coupled plasma mass spectrometry.