An Expert System for EPMA |
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Authors: | Cécile Fournier Claude Merlet Pierre F Staub Olivier Dugne |
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Institution: | (1) ISTEEM. CNRS, Université de Montpellier II, Sciences et Techniques du Languedoc, Pl. E. Bataillon, 34095 Montpellier Cedex 5, France, FR;(2) CEA VALRHO, DCC/DTE/SIM, BP 111, 26702, Pierrelatte Cedex, France, FR;(3) CAMECA, 103 bd St Denis, BP 6, 92403 Courbevoie Cedex, France, FR |
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Abstract: | Experimental parameters for an electron microprobe are numerous and their choice influence the quality and accuracy of the
analysis results. The expert system intends to optimise the choice of every parameter as well as to automate the stages of
a quantitative analysis for all kinds of materials. In short, the expert system aims to master the accuracy of results and
to control the time of analysis.
The starting point of the expert system is an interactive questionnaire about the sample and about the expectations of the
analysis (the accuracy of the result and/or the duration of the analysis). Then, the expert system makes a semi-quantitative
analysis on the sample. It gives the sample composition in a first approximation. This is necessary for the expert system
to optimise all the parameters for an accurate quantitative analysis. Each parameter is modelled by a specific algorithm.
The expert system selects the parameters by minimising, at every stage, the statistical error generated by the algorithm.
In this way, it operates in a sufficiently independent way to create a quantitative analysis configuration adapted to an unknown
sample.
The expert system employs the usual methods of quantification but the results are obtained in half the time. Moreover, the
accuracy of the result is guaranted by the statistical error calculation as the expert system is running. |
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Keywords: | : Wavelength dispersive spectrometry expert system semi-quantitative analysis background calculation |
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