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Electronic transport properties of bismuth nanobridges through silicon-nitride membranes
Authors:F Prez-Willard  C Sürgers  H Von Lhneysen  P Pfundstein
Institution:a Physikalisches Institut, Universität Karlsruhe, Wolfgang-Gaede-Str.1, D-76128, Karlsruhe, Germany;b Forschungszentrum Karlsruhe, Institut für Festkörperphysik, D-76021, Karlsruhe, Germany;c Laboratorium für Elektronenmikroskopie, Universität Karlsruhe, D-76128, Karlsruhe, Germany
Abstract:The electronic transport through nanostructured bismuth nanobridges has been investigated at low temperatures (T<2 K) and in magnetic fields B up to 8.5 T. The samples show reproducible resistance fluctuations as a function of B, superimposed on a large magnetoresistance of up to 50%. In addition, time-dependent resistance fluctuations in zero magnetic field demonstrate the presence of bistable scatterers in the constriction region of our samples, which are described by two-level systems. Their dynamics are shown to be sensitive to subtle modifications of the static scatterer configuration in their vicinity, which cannot be detected in the sample magnetofingerprint.
Keywords:Nanostructured point contacts  Point contact spectroscopy  Magnetoresistance  Conductance fluctuations  Two-level systems
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