短波长X射线衍射检测晶体材料内部缺陷的边界阈值法

在普通X射线源上进行X射线衍射断层扫描成像检测晶体材料内部缺陷的研究极少,短波长X射线衍射仪(short wavelcngth X-ray diffractometer,SWXRD)相比同步辐射装置,体积小巧、实用和维护费用低.在SWXRI)上进行X射线衍射断层扫描时,缺陷边界的确定直接影响成像的质量和缺陷的辨别.采用衍射强度阈值法对测试数据进行处理,使得缺陷边界清晰可辨.运用Gauss函数拟合测试数据探索各种因素对阈值大小的影响,解决阈值设定的难题.通过研究置于铝粉中的不同直径像质计对阈值大小的影响,发现阈值为基体强度的91%较合适.然后测试铝板上的细缝进一步验证了阈值法对缺陷边界的改善和阈值选择的准确性.

Boundary threshold value method used in crystalline material internal defect detection by short wavelength X-ray diffraction

There are few references about crystalline material internal defect detected by X-ray diffraction tomography using common X-ray source. Short wavelength X-ray diffractometer (SWXRD), invented by Institute of Southwest Technology Engineering, is a relatively small and inexpensive instrument compared to synchrotron radiation or neutron reactor. Boundary determination of defect affects the imaging quality and the distinguishing of defect in X-ray diffraction tomography using SWXRD. In the present paper, threshold value method of diffracted intensity is put forward to process the test data, so the boundary of defect is legible. In order to study how the factors influence the threshold value, Gauss function is used in fitting the test data. The influence of varisized image quality indicator pressed in powdered aluminum on threshold value has been studied. The result shows that 91% of the diffraction intensity of substrate can be regarded as the threshold value. The experiment of slit in aluminum alloy sheet further verified the threshold value method. It's useful in detecting the defect boundary.