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Ultrafast carrier dynamics in ferromagnetic InGaMnAs
Authors:J Wang  J Kono  A Oiwa  H Munekata  C J Stanton
Institution:a Department of Electrical and Computer Engineering, Rice University, Houston, TX 77005, USA;b Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, Yokohama, Kanagawa 226-8503, Japan;c Department of Physics, University of Florida, Gainesville, FL 32611, USA
Abstract:We have carried out an ultrafast time-resolved differential reflectivity study of a ferromagnetic semiconductor InGaMnAs and made a systematic comparison with low-temperature grown and high-temperature grown InGaAs reference films. Very short carrier lifetimes (2 ps) were observed in InGaMnAs and the low-temperature grown InGaAs film, but not in the high-temperature grown InGaAs film. We attribute the short lifetimes to carrier trapping by mid-gap states introduced during low-temperature MBE growth. Furthermore, at long times, we observed periodic oscillations in the differential reflectivity signal with period 20 ps, which we interpret as coherent acoustic phonons.
Keywords:III–  V ferromagnetic semiconductors  Ultrafast carrier dynamics
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