Analysis of silicon carbide powder by ETV-ICP-AES |
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Authors: | Gyula Zá ray, Franz Leis, Tibor Ká ntor, Jü rgen Hassler Gü nther Tö lg |
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Affiliation: | (1) Department of Inorganic and Analytical Chemistry, L. Eötvös University, P. O. Box 32, 1518 Budapest 112, Hungary;(2) Institut für Spektrochemie und angewandte Spektroskopie, Postfach 778, D-44013 Dortmund, Germany;(3) Elektroschmelzwerk Kempten GmbH, Postfach 1526, D-87405 Kempten, Germany |
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Abstract: | ![]() Summary A direct tandem atomic spectroscopic method for the determination of Ca, Fe and Ti impurities in SiC powders with various grain size (0.7850<48.5 m) has been developed. The method is based on high temperature halogenation of the sample with Freon 12 in a graphite furnace and ICP-AES detection of the evolved sample components. The concentration of the matrix element silicon in the ICP increased to a maximum value after 10s of heating, independent of the grain size of the powder samples. For performing a calibration with standard solutions a finegrained, purified SiC-powder was evaporated simultaneously with the solution residues. The calibration curves produced using this analyte-addition technique and using within-laboratory solid standards were identical within experimental error.Presented at the 5th International Colloquium on Solid Sampling with Atomic Spectroscopy, May 18–20, 1992; Geel, Belgium. Papers edited by R. F. M. Herber, Amsterdam |
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