X-ray scattering and polarization in wavelength-dispersive spectrometers |
| |
| Authors: | Batobolot Zhalsaraevich Zhalsaraev |
| |
| Affiliation: | Federal State Budgetary Institution of Science, Geological Institute of the Siberian Branch of the Russian Academy of Sciences (GIN SB RAS), Ulan-Ude, Russian Federation |
| |
| Abstract: | ![]()
Background suppression is discussed in wavelength-dispersive polarization X-ray spectrometer (WDPXRS), in which the goniometer scans in plane perpendicular to primary and secondary beams. Background suppression coefficients in WDPXRS and energy-dispersive polarization X-ray spectrometer are determined by different expressions (in “The scattering suppression of X-rays with energy of 20–200 keV in spectrometers with Barkla polarizers,” doi: 10.1002/xrs.3046 ). It is proposed to install silicon drift detectors in WDPXRS and implement energy-dispersive and wavelength-dispersive modes in one channel. |
| |
| Keywords: | scattering and polarization of X-rays XRF XRD WDS WDP XRS |
|
