| Modification of a YBa2Cu3O7—δ Thin Film Using an Atomic Force Microscope |
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| 引用本文： | 尤立星,尹晓波,等.Modification of a YBa2Cu3O7—δ Thin Film Using an Atomic Force Microscope[J].中国物理快报,2002,19(6):854-856. |
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| 作者姓名： | 尤立星 尹晓波 |
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| 作者单位： | [1]ResearchInstituteofSuperconductorElectronics,DepartmentofElectronicScienceandEngineering,NanjingUniversity,Nanjing210093 [2]StateKeyLaboratoryofSolidStateMicrostructures,DepartmentofP |
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| 摘 要： | A YBa2Cu3O7-δ thin film is modified by a probe electric field of an atomic force microscope to form a ridge with the width of only a grain cell.The modification varies with the operation parameters of the bias voltage,the moving velocity of the probe and the ambient humidity.Energy dispersive spectroscopy analysis shows only oxygen deficiency in the modified YBCO thin film.As a result,the suppressed superconductivity was found in the junction crossing the ridge.
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| 关 键 词： | 薄膜 YBa2Cu3O7－δ 显微镜 探测电场 |
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