Structure and transport properties of ultrathin YBa2Cu3O7−x
films |
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Authors: | A V Varganov E A Vopilkin P P Vysheslavtsev Yu N Drozdov Yu N Nozdrin S A Pavlov A E Parafin V V Talanov |
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Institution: | (1) Institute of Microstructure Physics, Russian Academy of Sciences, 603600 Nizhnii Novgorod, Russia |
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Abstract: | The crystal structure and transport properties of epitaxial c-oriented YBa2Cu3O7−x
films are investigated for high-T
c layer thicknesses from 5 to 300 nm. The films were prepared by laser deposition. Films less than 30 nm thick become predominantly
single-domain in the direction of the c axis. As the thickness decreases, the orthorhombicity parameter of the YBaCuO lattice decreases, which correlates with the
critical temperature degradation observed in films less than 9 nm thick. The obtained thickness dependence of the effective
microwave surface resistance of a YBaCuO film agrees well with the computational result obtained in the framework of local
electrodynamics for samples with a constant microwave conductance.
Pis’ma Zh. éksp. Teor. Fiz. 63, No. 8, 608–613 (25 April 1996) |
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Keywords: | |
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