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Specular and off-specular scattering with polarization and polarization analysis on reflectometer V6 at BER II, HZB |
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| Authors: | Amitesh Paul Thomas KristAnke Teichert Roland Steitz |
| Affiliation: | a Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, D-14109 Berlin, Germany b Laboratorium voor Vaste-Stoffysica en Magnetisme, Katholieke Universiteit Leuven, 3001 Leuven, Belgium c Instituut voor Kern- en Stralingsfysica and INPAC, K.U.Leuven, Celestijnenlaan 200D, B-3001 Leuven, Belgium |
| Abstract: | We report on the enhanced capabilities of neutron reflectometer V6 at the research reactor BER II at Helmholtz-Zentrum Berlin für Materialien und Energie (HZB) in investigating magnetic thin films and multilayers. It is now fully equipped for simultaneous measurements of specular and off-specular scattering with polarization and polarization analysis. The magnetization configuration of a [CoO/Co/Au]×16 polycrystalline multilayer at room temperature is reported in demonstrating the efficiency of the instrument. The data is simulated within the supermatrix formalism under the distorted wave Born approximation for a quantitative analysis. |
| Keywords: | Polarized neutron reflectometry Magnetic properties of interfaces |
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