A subwavelength metal-grating assisted sensor of Kretschmann style for investigating the sample with high refractive index

In this paper, a subwavelength metal-grating assisted sensor of Kretschmann style that is capable of detecting the sample with a refractive index higher than that of the substrate is proposed. The sensor configuration is similar to the traditional Kretschmann structure, but the metal film is pattered into a grating. As a TM-polarized laser beam impinges from the substrate, a resonant dip point in reflectance curve is produced at a certain incident angle. Our studies indicate that the sensing sensitivity and resolution are affected by the grating's gap and period, and after these parameters have been optimized, a sensing sensitivity of 51.484°/RIU is obtained with a slightly changing resolution.