首页 | 本学科首页   官方微博 | 高级检索  
     


Application of colloid probe atomic force microscopy to the adhesion of thin films of viscous and viscoelastic silicone fluids
Authors:Bowen James  Cheneler David  Andrews James W  Avery Andrew R  Zhang Zhibing  Ward Michael C L  Adams Michael J
Affiliation:School of Chemical Engineering, The University of Birmingham, Edgbaston, Birmingham B15 2TT, United Kingdom.
Abstract:The adhesive characteristics of thin films (0.2-2 μm) of linear poly(dimethylsiloxane) (PDMS) liquids with a wide range of molecular weights have been measured using an atomic force microscope with a colloid probe (diameters 5 and 12 μm) for different separation velocities. The data were consistent with a residual film in the contact region having a thickness of ~6 nm following an extended dwell time before separation of the probe. It was possible to estimate the maximum adhesive force as a function of the capillary number, Ca, by applying existing theoretical models based on capillary interactions and viscous flow except at large values of Ca in the case of viscoelastic fluids, for which it was necessary to develop a nonlinear viscoelastic model. The compliance of the atomic force microscope colloid beam was an important factor in governing the retraction velocity of the probe and therefore the value of the adhesive force, but the inertia of the beam and viscoelastic stress overshoot effects were not significant in the range of separation velocities investigated.
Keywords:
本文献已被 PubMed 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号