Low energy and low dose electron irradiation of potassium–lime–silicate glass investigated by XPS. I. Surface composition

X-ray induced photoelectron spectroscopy has been used to study the influence of low-energy electron beam on the pristine potassium–lime–silicate glass surface prepared by fracturing in situ under ultrahigh vacuum. Relatively low-energy electron beam of 1600 eV with low-electron beam current density of 0.02–0.22 A/m² and low-electron dose of 29–5200 C/m² was used. The expected modified near-surface region thickness is in this case comparable with the mean sampling depth of the analytical tool. Therefore, possible changes and modifications due to electron irradiation could be recorded with high sensitivity. The freshly fractured glass surface was found to be significantly enriched with potassium, and slightly with calcium. As a consequence of the lowest electron dose irradiation used, the potassium signal substantially increased by a factor 1.24 relative to the value found for the fresh surface. For higher doses used, the potassium signal continuously increased with the dose to a maximum and decreased thereafter. This variation was accompanied with the qualitative opposite behaviour of calcium signal. The concentrations of the other elements present in the glass, oxygen and silicon, varied only slightly with the electron dose. They can be considered to be constant within experimental uncertainty. In agreement with experimental results, a model assuming mobility of only two most mobile cations, potassium and calcium, was suggested. The models assuming one layer and two layers on the bulk were developed. Their results reproduce well experimental findings: (i) the formation of a potassium-rich surface layer, and (ii) the opposite-like signal variation of calcium in comparison with potassium.